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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
By:
Chandra Shakher
Contributor(s):
Samir Kumar
Material type:
Text
Publication details:
London
INTECHOPEN Ltd.
2022
Description:
xi,262p.ill.:26.1cm
ISBN:
978-1-83968-229-2
DDC classification:
502.82 SHA
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TIA MWANZA
MWANZA GENERAL COLLECTION
502.82 SHA (
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