| 000 | 00545nam a22001817a 4500 | ||
|---|---|---|---|
| 999 |
_c4909 _d4909 |
||
| 005 | 20240108153428.0 | ||
| 008 | 240108b ||||| |||| 00| 0 eng d | ||
| 020 | _a978-1-83968-229-2 | ||
| 040 | _cTIA Library | ||
| 082 | _a502.82 SHA | ||
| 100 | _aChandra Shakher | ||
| 245 | _aRecent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization | ||
| 260 |
_aLondon _bINTECHOPEN Ltd. _c2022 |
||
| 300 | _axi,262p.ill.:26.1cm. | ||
| 500 | _aIncludes References | ||
| 700 | _aSamir Kumar | ||
| 942 |
_2ddc _cBKS |
||