Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Material type:
- 978-1-83968-229-2
- 502.82 SHA
Item type | Current library | Call number | Status | Date due | Barcode | |
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TIA MWANZA MWANZA GENERAL COLLECTION | 502.82 SHA (Browse shelf(Opens below)) | Available | 10002264 |
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Includes References
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